D-COAX, INC. • 8201 Jade Tree Ln.
Knoxville, TN 37938 USA
Ph: 503-550-9434 • info@d-coax.com
D-COAX, INC. • 8201 Jade Tree Ln.
Knoxville, TN 37938 USA
Ph: 503-550-9434 • info@d-coax.com
During 32 years of experience in the test, measurement, and wafer probing industry, the company founders noted that there are needs not being met in the high frequency/high quality/fair price coaxial cable assemblies, low cost probe stations, and a general purpose probe station. And so development began …
D-COAX offers testing solutions beyond a routine test. D-COAX has available the analysis of the test data and device for the improvement of the transmission characteristics that is coupled with engineering in modeling, design, prototype, and fabrication. This leads to a better interconnect/assembly with superior performance.
Used by the electronics/semiconductor test and measurement industry for accurately and rigidly holding a plurality of test probes while situating the probe over a device under test (DUT). Also used to provide a temporary connection to the DUT during a measurement to demonstrate the wafer is as specified, prior to investing production time and costs in a defective wafer. Probing allows immediate evaluation for device characterization before dicing and packaging. In-process monitoring of key model parameters provides up-front information of production runs. These probe stations are often used for printed circuit board test and printed circuit board assemblies.
This is a multiple feature/low cost/portable probe station. Model W2.5 x L6.5 prober is a totally new concept in probing, makes a probe station affordable for several engineers in the same department to own, or for a user to modify it because of the low cost. The small size and light weight makes this probe station easy to transport in your back-pack. The multiple features probe station let the user make measurements easier.
Since the DUT may be very large, a new design needed to be developed. D-Coax D14 Analytical Probe station provides the top plates split into 2 pieces for the X-direction and each of the top plates also have the Y-direction segregated. The X-direction of the probe situating is done with accurate/rigid linear slides and rails, as is the Y-direction of the probe situating. In addition, while the X and Y direction of the chuck is stationary, the chuck has the ability to rotate. The top plates have complete coverage of very large DUT's.
It helps to have the top plates able to do large amounts of movement and reach, as this allows for short and strong probe arms needed for accurate probing. Further, the Y-direction has the ability to gang positioners together or segregate positioners for probe-to-probe variable pitch probing or individual positioner situating at high speed (coarse) as well as slow (fine) speed. The very large chuck has a rotation mechanism to allow for DUT alignment and reversal during calibrations and testing.
The no backlash rotation also allows for highly accurate DUT placement and testing. The vertical adjustment (during probing) of the top plates (that can be locked in any position) allows for the DUT to be probed with different types of probes and for different height structures to be probed.
Vacuum is used to keep the DUT (or several DUT's) securely in place during rotation alignment, X-direction situating of the probes, Y-direction situating of the probes, and Z-direction situating of the probes. In the case of several DUT's, independent vacuum is applied through on/off valves that are in 1 to 1 correlation of the chuck hole pattern so that the user does not accidentally disrupt the vacuum and misalign the other DUT’s. while working on the next DUT. The vacuum pattern is in concentric circles and individual diagonal patterns, as is the pattern for the vacuum valves.
It depends on the probe and the structure being probed. Most structures need about 20 ounces. Check with the probe manufacturer.